Title :
Angular response of perforated silicon diode high efficiency neutron detectors
Author :
Bellinger, S.L. ; McNeil, W.J. ; Unruh, T.C. ; McGregor, D.S.
Author_Institution :
Kansas State Univ., Manhattan
fDate :
Oct. 26 2007-Nov. 3 2007
Abstract :
Perforated silicon diodes with two different etched patterns were tested for neutron counting efficiency and angular response. The etched patterns consisted of circular holes on a square lattice or continuous sinusoidal waves. Normal incident neutron counting efficiencies were determined to be 21% and 35% for circular hole and sinusoidal devices, respectively. A nonuniform angular response was identified for the circular hole perforated devices. For the circular hole patterns, a reduction in efficiency appeared at azimuthal angles near 0deg and 90deg, each referenced at a 90deg polar angle about the normal axis. The nonuniform angular response is due to neutron streaming paths through the square lattice. The sinusoidal device angular response was uniform and matched well to that of a standard simple planar device.
Keywords :
neutron detection; silicon radiation detectors; circular hole perforated devices; efficiency 21 percent; efficiency 35 percent; high efficiency neutron detectors; neutron counting efficiency; perforated silicon diodes; sinusoidal device angular response; Detectors; Etching; Lattices; Neutrons; Nuclear and plasma sciences; Schottky barriers; Schottky diodes; Silicon; Testing; Thin film devices;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0922-8
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2007.4436528