• DocumentCode
    469638
  • Title

    X-ray CCD with low noise charge injection structure

  • Author

    Prigozhin, G. ; Bautz, M. ; Kissel, S. ; LaMarr, B.

  • Author_Institution
    Massachusetts Inst. of Technol., Cambridge
  • Volume
    3
  • fYear
    2007
  • fDate
    Oct. 26 2007-Nov. 3 2007
  • Firstpage
    2271
  • Lastpage
    2277
  • Abstract
    A frame transfer CCD designed for X-ray detection in space on-board the SUZAKU spacecraft includes an input serial register and a charge injection structure which allows a very uniform injection of extremely small charge packets into the imaging section of the device. The amount of injected charge can be controlled with very high accuracy. Precise measurements were performed of signal and noise as a function of gate voltages and injection timing parameters helping to extract physical characteristics of the charge injection structure. Very small charge packets can be reproducibly injected with noise as low as 5 electrons rms. We demonstrate that this charge injection structure is an extremely useful tool in studying and mitigating radiation effects in CCDs. It allows for fast and accurate calibration of radiation damage suffered by CCDs in space environment. Charge loss in each column of a CCD can be determined with just a few frames of data. Applying the results of these measurements to data analysis allows to correct for column-to-column nonuniformities and improves energy resolution of a damaged CCD. Charge loss as a function of charge has been measured down to very low signal levels, this dependence is also an important factor in developing CTI-correction algorithms. Studying variance of the trap distribution over different columns of a CCD we were able to make certain conclusions about a about charge state of the traps. This technique can be used in studying trap composition of devices. We experimentally confirmed that periodically injecting charge-filled rows it is possible to significantly improve CCD charge transfer inefficiency that was induced by irradiation of a device. Injecting rows filled with charge fills the traps, they stay charged for some time and do not contribute to a charge loss. This technique has been tested and proved useful. Both CTI and energy resolution of the device have shown significant improvements.
  • Keywords
    X-ray detection; charge-coupled devices; position sensitive particle detectors; radiation effects; semiconductor counters; space vehicles; CCD design; SUZAKU spacecraft; X-ray detection; charge coupled device; charge injection structure; charge loss; charge packets; charge transfer inefficiency; column-to-column nonuniformities; energy resolution; gate voltages; radiation damage; radiation effects; serial register; Charge coupled devices; Charge measurement; Current measurement; Energy resolution; Noise measurement; Optical imaging; Space charge; Space vehicles; X-ray detection; X-ray imaging; X-ray; charge coupled device; charge injection; electron traps; radiation damage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-0922-8
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2007.4436599
  • Filename
    4436599