Title :
Development and performance evaluation of cost-effective micro-CT
Author :
Heo, Sung Kyn ; Yun, Seung Man ; Cho, Min Kook ; Kim, Ho Kyung ; Graeve, Thorsten ; Cho, Hyosung
Author_Institution :
Pusan Nat. Univ., Pusan
fDate :
Oct. 26 2007-Nov. 3 2007
Abstract :
We have developed a cost-effective micro- tomography (micro-CT) system. The system consists of an X-ray source with small focus spot, an object (or subject) jig, and an X-ray imaging detector. A computer-controlled rotation system was adopted in the object jig to achieve a cone-beam mode scan. The core of the system is an X-ray imaging detector. Since imaging performance of the detector is mostly responsible for the resultant image quality and eventually determines the quality of a tomogram, characterization of the imaging performance of the detector is an important issue for optimizing the design of the imaging system. We have evaluated the imaging characteristics of the detector in terms of modulation-transfer function (MTF), noise-power spectrum (NPS), and detective quantum efficiency (DQE). Tomographic imaging performances of the system, such as signal-to-noise ratio (SNR), contrast-to-noise ratio (CNR) have also been evaluated by using various quantitative phantoms. The details of experimental results will be discussed with the system´s own limitations.
Keywords :
computerised tomography; optical transfer function; optimisation; performance evaluation; phantoms; X-ray imaging detector; computer-controlled rotation system; cone-beam mode scan; contrast-to-noise ratio; cost-effective micro-CT; design optimization; detective quantum efficiency; image quality; modulation-transfer function; noise-power spectrum; performance evaluation; quantitative phantom; signal-to-noise ratio; tomographic imaging performance; Design optimization; Focusing; Image quality; Object detection; Optical imaging; Performance evaluation; Tomography; X-ray detection; X-ray detectors; X-ray imaging;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0922-8
DOI :
10.1109/NSSMIC.2007.4436932