DocumentCode :
469977
Title :
Stability and characteristics of 3D HgI2 detectors at different cathode bias
Author :
Zhu, Yuefeng ; Kaye, Willy ; He, Zhong ; Zhang, Feng
Author_Institution :
Univ. of Michigan, Ann Arbor
Volume :
2
fYear :
2007
fDate :
Oct. 26 2007-Nov. 3 2007
Firstpage :
1537
Lastpage :
1540
Abstract :
This article presents our studies on the first fully pixelated 3-dimensional (3D) position-sensitive HgI2 detectors, manufactured by Constellation Technology Corporation. The radiation signals were read out using a VAS_UM3.2/TAT4 ASIC readout system. The performance of several detectors was investigated over a period of time and at different operational bias voltages. The resolution for single-pixel-triggered events was measured as good as 1.60% at 662 keV. 1.20% FWHM energy resolution was observed on the best anode pixel, demonstrating the potential to achieve better resolution on HgI2 detectors. It was found that the trapping of electrons is much lower in those HgI2 detectors. The resolution changes inside the detector bulk are minor. The stability of the detectors was examined and all detectors with the history of being biased up within one month show little variance of photopeak centroid and resolution. However, one detector unbiased for three months is found to have performance variance over time. Slight improvement of resolution with cathode bias raised from -3000 V to -4000 V is observed.
Keywords :
anodes; application specific integrated circuits; cathodes; nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor counters; Constellation Technology Corporation; FWHM energy resolution; VAS_UM3.2/TAT4 ASIC readout system; anode pixel; cathode bias; detector stability; electron trapping; pixelated 3D position-sensitive HgI2 detectors; radiation signals; single-pixel-triggered events; Anodes; Application specific integrated circuits; Cathodes; Energy measurement; Energy resolution; Manufacturing; Position sensitive particle detectors; Signal resolution; Stability; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location :
Honolulu, HI
ISSN :
1095-7863
Print_ISBN :
978-1-4244-0922-8
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2007.4437291
Filename :
4437291
Link To Document :
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