Experimental measurement of the electroelastic effect in thickness-mode langasite resonators

Author

Haifeng Zhang ; Turner, J.A. ; Jiashi Yang ; Kosinski, J.A. ; Yuanye Bao

Author_Institution

Dept. of Eng. Technol., Univ. of North Texas, Denton, TX, USA

Volume

60

Issue

5

fYear

2013

fDate

May-13

Firstpage

970

Lastpage

974

Abstract

The electroelastic effect describes the shift in resonant frequency that a resonator experiences as a result of the application of a dc electrical field. We report on experimental measurements of the electroelastic effect observed in fourteen plano-plano configuration thickness-mode langasite (La₃Ga₅SiO₁₄) resonators. The orientations of the fourteen samples provide a sufficient data set to extract all eight of the third-order piezoelectric constants of this material. The role of this type of measurement in determining third-order piezoelectric constants is discussed. We compare the experimentally observed behavior to that predicted when using the langasite material constants currently available in the literature.

Keywords

crystal resonators; gallium compounds; lanthanum compounds; piezoelectric materials; piezoelectricity; La₃Ga₅SiO₁₄; dc electrical field; electroelastic effect; langasite material; plano-plano configuration thickness-mode langasite resonators; resonant frequency; third-order piezoelectric constants;

fLanguage

English

Journal_Title

Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on

Publisher

ieee

ISSN

0885-3010

Type

jour

DOI

10.1109/TUFFC.2013.2654

Filename

6512834