DocumentCode :
470449
Title :
Electron beam projection nanopatterning using crystal lattice images obtained from high resolution transmission electron microscopy
Author :
Lee, H.-S. ; Kim, B.-S. ; Kim, H.-M. ; Wi, J.-S. ; Nam, S.-W. ; Kim, K.-B. ; Arai, Y.
Author_Institution :
Seoul Nat. Univ., Seoul
fYear :
2007
fDate :
5-8 Nov. 2007
Firstpage :
418
Lastpage :
419
Abstract :
The fabrication of nanometer-scale features such as quantum dots and quantum wires, in a controllable and economically viable manner is one of essential requirements for the production of highly functional devices. Here, we propose a new electron beam projection lithography technique for patterning nanometer scale, periodic structures. The novelty of this technique is that the crystalline lattice image observed by high resolution transmission electron microscopy (HRTEM) is employed as the ultimate mask to define nanometer scale pattern. Namely, the Angstrom-scale lattice image of a crystalline material is magnified within the electron microscope, and is projected onto an electron-beam-resist-coated substrate. This technique is tentatively called AIPEL (atomic image projection electron-beam lithography).
Keywords :
electron beam lithography; nanolithography; nanopatterning; periodic structures; transmission electron microscopy; AIPEL; Angstrom-scale lattice image; atomic image projection electron-beam lithography; crystal lattice images; crystalline material; electron beam projection lithography technique; electron microscope; electron-beam-resist-coated substrate; high resolution transmission electron microscopy; nanometer scale pattern; nanometer scale periodic structures; nanopatterning; quantum dots; quantum wires; Electron beams; Fabrication; Image resolution; Lattices; Lithography; Nanopatterning; Nanoscale devices; Quantum dots; Transmission electron microscopy; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology, 2007 Digest of papers
Conference_Location :
Kyoto
Print_ISBN :
978-4-9902472-4-9
Type :
conf
DOI :
10.1109/IMNC.2007.4456282
Filename :
4456282
Link To Document :
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