• DocumentCode
    47084
  • Title

    Effect of pulsed discharge current on lifetime performance of metallized polypropylene film capacitors

  • Author

    Hua Li ; Bowen Wang ; Zhiwei Li ; De Liu ; Haoyuan Li ; Qin Zhang ; Fuchang Lin ; Yaohong Chen

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • Volume
    21
  • Issue
    3
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    957
  • Lastpage
    963
  • Abstract
    Metallized polypropylene film capacitors (MPPFCs) are the key components in pulsed power systems. The self-healing property guarantees MPPFCs´ application under high electric fields. This paper mainly concentrates on the effect of the pulsed discharge current on the lifetime performance. The end connection peak current density (Id) and reversal coefficient (β) are two critical parameters which affect the lifetime. Experiments are designed to investigate the lifetime under different Id and β. The results indicate that the lifetime is sensitive to β. Empirically derived lifetime-scaling equation is given to predict the lifetime under different β. When Id is higher than 13 A/m, the electrode fracture might occur in the MPPFCs and the probability of the sudden capacitance drop will increase. Therefore, this phenomenon results in lifetime reduction.
  • Keywords
    current density; power capacitors; pulsed power technology; MPPFC; electrode fracture; end connection peak current density; high electric fields; lifetime performance; lifetime reduction; lifetime-scaling equation; metallized polypropylene film capacitors; pulsed discharge current; pulsed power systems; reversal coefficient; self-healing property; Capacitance; Capacitors; Discharges (electric); Electric fields; Electrodes; Films; Heating; Metallized polypropylene film capacitors; end connection peak currentdensity; lifetime; reversal coefficient;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2014.6832237
  • Filename
    6832237