• DocumentCode
    471406
  • Title

    Characterizing 3-D Geometry of Mouse Aortic Arch Using Light Stereo-Microscopic Imaging

  • Author

    Zhu, Hui ; Shih, Jessica ; Long, David S. ; Maeda, Nobuyo ; Hagaman, John R. ; Friedman, Morton H.

  • Author_Institution
    Dept. of Biomed. Eng., Duke Univ., Durham, NC
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    385
  • Lastpage
    388
  • Abstract
    The vascular geometry may play an important role in the development of atherosclerosis by modulating the local hemodynamics and mechanical stresses of the vessel wall. The mouse is now the most popular animal model to study cardiovascular disease. Here, we present a method to characterize the 3-D geometry of mouse aortic arches by casting and light stereo-microscopic imaging. After calibration of the stereo-microscopic imaging system, the 3-D axis of an aortic cast is reconstructed using two stereo images. Based on the analysis of this 3-D curve, a geometry-based definition of the arch segment is given, and some geometric features, including curvature, torsion, and symmetry, have been derived. Casts from a C57BL6 and a SVEV mouse have been processed. This method will be used to detect the geometric difference of the aortic arch among different mouse strains
  • Keywords
    biomechanics; biomedical optical imaging; blood vessels; calibration; cardiovascular system; computational geometry; diseases; haemodynamics; image reconstruction; medical image processing; stereo image processing; 3-D vascular geometry; C57BL6 mouse strain; SVEV mouse strain; atherosclerosis; calibration; cardiovascular disease; hemodynamics; image reconstruction; light stereo-microscopic imaging; mechanical stresses; mouse aortic arch; vessel wall; Animals; Atherosclerosis; Calibration; Cardiovascular diseases; Casting; Geometry; Hemodynamics; Image reconstruction; Mice; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260033
  • Filename
    4461767