• DocumentCode
    471479
  • Title

    In vivo and In vitro Differences in the Charge-injection and Electrochemical Properties of Iridium Oxide Electrodes

  • Author

    Cogan, Stuart F.

  • Author_Institution
    EIC Labs. Inc., Norwood, MA
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    882
  • Lastpage
    885
  • Abstract
    The electrochemical response of activated iridium oxide (AIROF) electrodes implanted acutely in the subretinal space of the rabbit is compared with in vitro measurements in model electrolytes. Voltage transients during current pulsing, cyclic voltammetry, impedance spectroscopy and open-circuit potential measurements were compared. Subretinal charge injection by constant current pulsing required significantly greater driving voltages due to both higher access resistances (iR) and large electrochemical polarization across the electrode-tissue interface. Differences in the in vivo and in vitro open-circuit potentials were also noted. The data suggest that the buffering capacity in the subretinal space, at least in the acute study, is higher than that in inorganic models of interstitial fluid. Possible origins of these differences in terms of electrode-tissue interactions are discussed
  • Keywords
    biological tissues; biomedical electrodes; electrochemical electrodes; iridium compounds; voltammetry (chemical analysis); AIROF; IrO; activated iridium oxide electrode; charge-injection; current pulsing; cyclic voltammetry; electrochemical polarization; electrochemical properties; electrode-tissue interface; electrolytes; impedance spectroscopy; open-circuit potential; open-circuit potential measurement; rabbit; subretinal space; voltage transients; Current measurement; Electrical resistance measurement; Electrochemical impedance spectroscopy; Electrodes; Impedance measurement; In vitro; In vivo; Polarization; Rabbits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.259654
  • Filename
    4461893