DocumentCode
471543
Title
Assessment of Preprocessing on Classifiers Used in the P300 Speller Paradigm
Author
Mirghasemi, H. ; Shamsollahi, M.B. ; Fazel-Rezai, R.
Author_Institution
Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
1319
Lastpage
1322
Abstract
Artifact removal is an essential part in electroencephalogram (EEG) recording and the raw EEG signals require preprocessing before feature extraction. In this work, we implemented three filtering methods and demonstrated their effects on the performance of different classifiers. Bandpass digital filtering, median filtering and facet method are three preprocessing approaches investigated in this paper. We used data set lib from the BCI competition 2003 for training and testing phase. Our accuracy varied between 80% and 96%. In our work, we demonstrated that the problems of choosing the classifier and preprocessing methods are not independent of each other. Two of our approaches could achieve the 96% accuracy i.e. 31 of 32 characters were predicted correctly. These two approaches have different classifier and different preprocessing method. It means that the performance of each classifier can be enhanced with a specific preprocessing method. In our approach, we used only three electrodes of 64 applied electrodes. Therefore it can noticeably reduce the time and cost of EEG measurement
Keywords
band-pass filters; biomedical electrodes; electroencephalography; feature extraction; median filters; medical signal processing; signal classification; EEG; P300 speller paradigm; artifact removal; bandpass digital filtering; electrodes; electroencephalogram recording; facet method; feature extraction; median filtering; signal preprocessing; Band pass filters; Cities and towns; Digital filters; Electrodes; Electroencephalography; Feature extraction; Filtering; Noise reduction; Principal component analysis; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.259520
Filename
4462003
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