• DocumentCode
    471598
  • Title

    Optimal Denoising of Brainstem Auditory Evoked Response (Baer) for Automatic Peak Identification and Brainstem Assessment

  • Author

    Jacquin, Arnaud ; Causevic, Elvir ; John, E. Roy ; Prichep, Leslie S.

  • Author_Institution
    Everest Biomed. Instrum., Chesterfield, MO
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    1723
  • Lastpage
    1726
  • Abstract
    Brainstem auditory evoked responses (BAER) are transient signals embedded in the EEG recorded from scalp electrodes, when a subject is presented with a series of acoustic clicks. These signals typically have a signal-to-noise ratio (SNR) well below -10 dB. The extraction of BAER signals from the EEG for the purpose of automatically computing features of interest from the BAER waveform(s) is described in this paper. These features are: 1) Presence of an actual BAER response (at least peak I), 2) Presence of peak V, 3) Inter-peak latency I-V. We propose to combine a signal-adaptive denoising technique based on complex wavelets with a signal quality metric referred to as the FSP variance ratio for quantitative evaluation of signal quality in order to optimally denoise BAER signals and perform reliable waveform analysis
  • Keywords
    adaptive signal processing; auditory evoked potentials; electroencephalography; medical signal detection; medical signal processing; signal denoising; EEG; SNR; automatic peak identification; brainstem assessment; brainstem auditory evoked response; optimal denoising; scalp electrodes; signal extraction; signal quality; signal-adaptive denoising technique; signal-to-noise ratio; transient signals; variance ratio; waveform analysis; Acoustic waves; Band pass filters; Biomedical measurements; Brain modeling; Delay; Ear; Electrodes; Electroencephalography; Frequency; Noise reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.259785
  • Filename
    4462105