Title :
Efficient 3-D Medical Image Registration Using a Distributed Blackboard Architecture
Author :
Tait, Roger J. ; Schaefer, Gerald ; Hopgood, Adrian A. ; Zhu, Shao Ying
Author_Institution :
Sch. of Comput. & Informatics, Nottingham Trent Univ.
fDate :
Aug. 30 2006-Sept. 3 2006
Abstract :
A major drawback of 3-D medical image registration techniques is the performance bottleneck associated with re-sampling and similarity computation. Such bottlenecks limit registration applications in clinical situations where fast execution times are required and become particularly apparent in the case of registering 3-D data sets. In this paper a novel framework for high performance intensity-based volume registration is presented. Geometric alignment of both reference and sensed volume sets is achieved through a combination of scaling, translation, and rotation. Crucially, resampling and similarity computation is performed intelligently by a set of knowledge sources. The knowledge sources work in parallel and communicate with each other by means of a distributed blackboard architecture. Partitioning of the blackboard is used to balance communication and processing workloads. Large-scale registrations with substantial speedups, when compared with a conventional implementation, have been demonstrated
Keywords :
blackboard architecture; client-server systems; image registration; image sampling; medical image processing; parallel processing; 3-D medical image registration; blackboard partitioning; client-server blackboard architecture; distributed blackboard architecture; geometric alignment; image resampling; image scaling; image translation; intensity-based volume registration; knowledge sources; large-scale registrations; similarity computation; Biomedical imaging; Cities and towns; Computer architecture; Concurrent computing; Distributed computing; Image registration; Large-scale systems; Message passing; USA Councils; Velocity measurement;
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2006.260146