Title : 
Joint Optimization of Spatial Registration and Histogram Compensation for Microscopic Images
         
        
            Author : 
Kim, Dong Sik ; Lee, Kiryung ; Lee, Kyung Eun ; Han, Sung Sik
         
        
            Author_Institution : 
Sch. of Electron. & Inf. Eng., Hankuk Univ. of Foreign Studies
         
        
        
            fDate : 
Aug. 30 2006-Sept. 3 2006
         
        
        
        
            Abstract : 
An iterative registration algorithm, the Lucas-Kanade algorithm, is combined with the histogram transformation to jointly optimize the spatial registration and the histogram compensation. Based on a simple regression model, a nonparametric estimator, the empirical conditional mean, is used for the histogram transformation function. The proposed algorithm provides a good performance in registering microscopic images that have different exposure or histogram properties, and can easily adopt other histogram compensation schemes and variations of the Lucas-Kanade algorithms due to its implicit flexibility. Joint registration with a third-order polynomial warp and compensation is conducted for microscopic images that have different magnifications
         
        
            Keywords : 
compensation; image registration; iterative methods; medical image processing; microscopy; polynomial approximation; Lucas-Kanade algorithm; empirical conditional mean; histogram compensation; iterative registration algorithm; joint optimization algorithm; microscopic images; nonparametric estimator; spatial registration; third-order polynomial warp; Cities and towns; Histograms; Image reconstruction; Iterative algorithms; Layout; Piecewise linear techniques; Pixel; Polynomials; Transmission electron microscopy; USA Councils; Histogram compensation; Lucas-Kanade algorithm; Registration;
         
        
        
        
            Conference_Titel : 
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
         
        
            Conference_Location : 
New York, NY
         
        
        
            Print_ISBN : 
1-4244-0032-5
         
        
            Electronic_ISBN : 
1557-170X
         
        
        
            DOI : 
10.1109/IEMBS.2006.259863