DocumentCode :
471883
Title :
A new scheme and reconstruction algorithm for dual source circular CT
Author :
Yan, Ming ; Zhang, Cishen ; Liang, Hongzhu
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ.
fYear :
2006
fDate :
Aug. 30 2006-Sept. 3 2006
Firstpage :
3783
Lastpage :
3786
Abstract :
Circular cone beam scanning has been a most popular scheme for computed tomography (CT) imaging, which is simple and can achieve symmetric projection data of the interested object. Many algorithms have been developed for circular cone beam CT. Many of these are FDK type algorithms, which can achieve good reconstruction quality when cone angle is small but may cause image deformation and density reduction at off plane when the cone angle is large. With the recently introduced dual source circular cone beam CT, we can deal with this problem under a new dual source geometry. In this paper, we propose a novel reconstruction scheme dual source circular cone beam CT by placing X-ray sources on two circular planes perpendicular to the rotating axis. We propose a reconstruction algorithm for this scanning scheme and evaluate the scanning scheme and the reconstruction algorithm with a 3D Shepp Logan phantom and a disk phantom. Simulation results show that the proposed method can provide improved reconstruction image quality for both in plane and off plane of the object
Keywords :
computerised tomography; image reconstruction; medical image processing; phantoms; 3D Shepp Logan phantom; FDK algorithm; X-ray source; circular cone beam scanning; computed tomography; disk phantom; dual source circular cone beam CT; image quality; reconstruction algorithm; symmetric projection data; Biomedical engineering; Chemical technology; Computed tomography; Detectors; Geometry; Image quality; Image reconstruction; Imaging phantoms; Reconstruction algorithms; X-ray imaging; Dual source CT; FDK algorithm; circular cone beam CT;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.259787
Filename :
4462623
Link To Document :
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