DocumentCode
471893
Title
Statistical Evaluation of The Cleft Lip Nose Deformity Image
Author
Kim, D.W. ; Kim, J.T. ; Hong, H.K. ; Nam, K.C. ; Park, J.H.
Author_Institution
Dept. of Med. Eng., Yonsei Univ. Coll. of Medicine, Seoul
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
3840
Lastpage
3842
Abstract
Cleft lip is a congenital deformity condition with separation of the two sides of the lip and causes nose deformity. Evaluation of surgical corrections and assessment of prognosis in nose deformity depend mainly on doctor´s subjective judgment. Development of an objective assessment tool in evaluation of the cleft lip nose deformity patients will help in advancement and evaluation of surgical techniques. Therefore, our study aimed on quantitative assessment of a cleft lip nose deformity by comparing following parameters gathered from a photographic image of a cleft lip patient: (1) angle difference between two nostril axes, (2) center of the nostril and distance between two centers, (3) overlapped area of two nostrils and (4) the overlapped area ratio of two nostrils. Assessment results of the nose deformity were statistically analyzed with evaluation results from three highly experienced plastic surgeons. In addition, regression model was developed using correlation relationship and factor analysis of parameters from the results of image analysis
Keywords
medical image processing; regression analysis; surgery; cleft lip nose deformity image; congenital deformity; correlation relationship; factor analysis; image analysis; nostril angle difference; nostril center; overlapped area; photographic image; plastic surgeon; prognosis assessment; regression model; statistical evaluation; surgical correction; Biomedical engineering; Biomedical imaging; Birth disorders; Cities and towns; Educational institutions; Image analysis; Medical diagnostic imaging; Nose; Surgery; USA Councils; Cleft lip; nose deformity; nostril;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.260429
Filename
4462637
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