• DocumentCode
    471927
  • Title

    Automated Masking of Voltage-Sensitive Dye Imaging Data

  • Author

    Phillips, Trevor P. ; Schmidt, Robyn ; Nygren, Anders

  • Author_Institution
    Schulich Sch. of Eng., Calgary Univ., Alta.
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    4035
  • Lastpage
    4038
  • Abstract
    This paper discusses the development of an algorithm to mask poor quality data in fluorescence videos of cardiac tissue stained with voltage-sensitive dye. The aim was to simplify further analysis by eliminating the step of manually masking areas of poor signal quality and areas outside the preparation of interest. Our algorithm estimates signal to noise ratio (SNR) from the power spectral density (PSD) for each pixel. This information is combined with information about the fluorescence intensity in each pixel, according to a user-selectable weighting factor. A threshold is then applied to the resulting combined measure. This approach resulted in an effective algorithm that is capable of automatically creating a "mask" that can be applied to the data to exclude parts of the data from further analysis. The algorithm is sufficiently efficient to allow interactive use, allowing the user to adjust the parameters of the algorithm and instantly view the resulting mask. This tool will be useful as a technique to simplify further analysis of voltage-sensitive dye imaging data
  • Keywords
    biological tissues; biomedical optical imaging; cardiology; data analysis; dyes; fluorescence; masks; automated masking; cardiac tissue stain; data analysis; fluorescence intensity; fluorescence videos; power spectral density; signal-to-noise ratio; user-selectable weighting factor; voltage-sensitive dye imaging; Background noise; Biomembranes; Data analysis; Fluorescence; Image analysis; Low-frequency noise; Mice; Signal to noise ratio; Videos; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260569
  • Filename
    4462685