• DocumentCode
    471951
  • Title

    Analysis of spatial dependencies of endocytic proteins based on temporal random sets

  • Author

    Sebastian, Rafael ; Diaz, Maria Elena ; Ayala, Guillermo ; Zoncu, Roberto ; Toomre, Derek

  • Author_Institution
    Dept. of Comput. Sci., Valencia Univ.
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    4175
  • Lastpage
    4178
  • Abstract
    Statistical image analysis has emerged as a basic methodology in the study of many real phenomena, which can be represented by sequences of binary images. Recent techniques, such as total internal reflection fluorescent microscopy, allow us to image simultaneously two fluorescent-tagged proteins which are relevant in important cellular processes, such as endocytosis. Here, we model these biological pairs of image sequences as realizations of a 3D non-isotropic bivariate random set, in which one dimension corresponds to time. We analyze their second-order properties by means of the cross-covariance and the pair correlation function in order to study colocalization between proteins. Results show the proposed methodology allows us to study spatial dependencies in a formal and robust way
  • Keywords
    biochemistry; biological techniques; cellular biophysics; fluorescence; image sequences; molecular biophysics; optical microscopy; proteins; statistical analysis; 3D nonisotropic bivariate random set; binary image sequence; biological pairs; cellular process; cross-covariance; endocytic proteins; endocytosis; fluorescent-tagged proteins; pair correlation function; spatial dependency; statistical image analysis; temporal random sets; total internal reflection fluorescent microscopy; Biological system modeling; Cities and towns; Fluorescence; Image analysis; Image sequence analysis; Image sequences; Microscopy; Proteins; Reflection; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260479
  • Filename
    4462721