• DocumentCode
    471963
  • Title

    Smooth bilinear classification of EEG

  • Author

    Dyrholm, Mads ; Parra, Lucas C.

  • Author_Institution
    City Coll., City Univ. of New York, NY
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    4249
  • Lastpage
    4252
  • Abstract
    The goal of this paper is to improve on single-trial classification of electro-encephalography (EEG) using linear methods. The paper proposes to combine the classification of the spatial distribution of activity with the classification of its temporal profile. The work is based on the idea that a current source in the brain has a reproducible temporal profile with a static spatial projection to the electrodes. This assumption reduces the parameter space of a linear classifier to a rank-one factorial space. The new model limits over-fitting due to the fewer number of parameters, and furthermore, it allows us to declare a prior belief of smoothness on the spatial and temporal profiles of the source. Our experiments show that the method is useful as a classifier with an area under the ROC curve of 0.93 having only 40 target trials available for training. Investigation of the trained classifier encourages us to belief that the method can also be useful as a tool to interpret the activity in the data at hand with respect to experimental events
  • Keywords
    electroencephalography; medical signal processing; neurophysiology; sensitivity analysis; signal classification; spatiotemporal phenomena; EEG; ROC curve; brain; electro-encephalography; electrodes; linear methods; parameter space reduction; smooth bilinear signal classification; spatial-temporal profiles; static spatial projection; Brain computer interfaces; Brain modeling; Cities and towns; Data mining; Electrodes; Electroencephalography; Logistics; Pattern recognition; Signal to noise ratio; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260083
  • Filename
    4462739