DocumentCode
471965
Title
Sub-second functional imaging by Electrical Impedance Tomography
Author
McCann, H. ; Polydorides, N. ; Murrieta-Lee, J.C. ; Ge, Kou ; Beatty, P. ; Pomfrett, C.J.D.
Author_Institution
Sch. of Electr. & Electron. Eng., Manchester Univ.
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
4269
Lastpage
4272
Abstract
Functional imaging of the human brain using electrical impedance tomography (EIT) is reported, where the measurement data were collected over a period of 308 ms. Initiation of the measurement sequence occurred at times ranging from 70 to 740 ms after administration of visual or auditory stimuli to two volunteers. The reconstructed images of conductivity change due to individual visual stimulus events correspond with anatomical regions known to be involved in visual sensory processing and the processing of cognitive reflexes. We propose that the mechanism enabling this EIT imaging capability is concerned with synaptic effects upon local conductivity of bulk brain tissue, which is supported by the observations of Klivington and Galambos. In turn, the sensitivity of EIT to this effect is much greater than previously expected, due to the high conductivity of in-vivo skull
Keywords
auditory evoked potentials; biomedical imaging; biomedical measurement; brain; electric impedance imaging; image reconstruction; neurophysiology; visual evoked potentials; 70 to 740 ms; EIT; anatomical regions; auditory stimuli; bulk brain tissue; cognitive reflexes processing; electrical impedance tomography; human brain; image reconstruction; in-vivo skull; local conductivity measurement; sub-second functional imaging; synaptic effects; visual sensory processing; visual stimuli; Biomedical imaging; Brain; Conductivity; Electric variables measurement; Electrodes; Humans; Impedance measurement; Skull; Tomography; Voltage; Scalp; brain; conductivity; electrical; fast; function; imaging; impedance; skull; tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.259504
Filename
4462744
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