DocumentCode
472012
Title
Using Component Synchrony Measure for somatosensory evoked potential detection
Author
Melges, Danilo Barbosa ; De Sa, Antonio Mauricio Ferreira Leite Miranda ; Catelli, Antonio Fernando
Author_Institution
Biomed. Eng. Program, Fed. Univ. of Rio de Janeiro
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
4572
Lastpage
4575
Abstract
The multiple component synchrony measure (MCSM), a multivariate objective response detection (MORD) technique in the frequency domain, was applied to EEG signals during somatosensory stimulation of the right posterior tibial nerve collected from derivations [Fpz´-Cz´] and [C3´-C4´] of 10 adult volunteers. Stimuli were applied at the rate of 4.91 Hz and at the motor threshold intensity level. Detection was identified based on the null hypothesis of response absence rejection - when the estimates exceed the critical values (significance level alpha=0.05 and M=100, 400 and 800 epochs). For these three M values, detection was obtained in at least 80 % of the volunteers for the frequency range from 34.3 to 54.0 Hz, within the gamma band. With M=400, however, response could be detected in all subjects for this frequency range. Similar performance was observed for M=800. These findings indicate that MCSM is capable of objectively identifying stimuli response
Keywords
bioelectric potentials; electroencephalography; frequency-domain analysis; neurophysiology; somatosensory phenomena; statistical analysis; 34.3 to 54.0 Hz; EEG signals; frequency domain; motor threshold intensity level; multiple component synchrony measure; multivariate objective response detection technique; right posterior tibial nerve; somatosensory evoked potential detection; Biomedical engineering; Cities and towns; Electroencephalography; Electronic mail; Frequency measurement; Frequency synchronization; Inspection; Pediatrics; Surgery; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.260034
Filename
4462820
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