• DocumentCode
    472028
  • Title

    Thickness dependent tortuosity estimation for retinal blood vessels

  • Author

    Azegrouz, Hind ; Trucco, Emanuele ; Dhillon, Baljean ; MacGillivray, Thomas ; MacCormick, I.J.

  • Author_Institution
    Joint Res. Inst., Heriot-Watt Univ., Scotland
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    4675
  • Lastpage
    4678
  • Abstract
    This paper describes a framework for the automated estimation of vessel tortuosity in retinal images. We introduce a new tortuosity metric that takes into account vessel thickness, yielding estimates plausibly closer to intuition and medical judgement than those from previous metrics. We also propose an algorithm identifying automatically a vasculature segment connecting two points specified manually. Starting from a binary image of the vasculature, the algorithm computes a skeletal (medial axis) representation on which all terminal and branching points are located. This is then converted to a graph representation including connectivity as well as thickness information for all vessels. Target segments for tortuosity estimation are identified automatically from end points selected manually using a shortest-path algorithm. Results are presented and compared with those provided by clinical classification on 50 vessels from DRIVE images. An overall agreement with clinical judgement of 92.4% is achieved, superior to that of comparison measures
  • Keywords
    biomechanics; biomedical measurement; blood vessels; eye; image representation; image segmentation; medical computing; medical image processing; DRIVE image; retinal blood vessel; retinal image; vessel tortuosity estimation; Biomedical imaging; Blood vessels; Current measurement; Image converters; Image processing; Image segmentation; Joining processes; Retina; Skeleton; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260558
  • Filename
    4462845