DocumentCode :
472075
Title :
Acquisition and Analysis of High Rate Deconvolved Auditory Evoked Potentials during Sleep
Author :
Millan, Jorge ; Ozdamar, Ozcan ; Bohorquez, Jorge
Author_Institution :
Dept. of Biomed. Eng., Miami Univ., Coral Gables, FL
fYear :
2006
fDate :
Aug. 30 2006-Sept. 3 2006
Firstpage :
4987
Lastpage :
4990
Abstract :
Auditory evoked potentials (AEPs) have been recorded at high stimulus rates during sleep using continuous loop averaging deconvolution (CLAD) sequences. AEP transient signals are obtained via frequency domain deconvolution of overlapped responses. Simultaneous acquisition of auditory brainstem response (ABR), middle latency response (MLR), and long latency response (LLR) is obtained at an average stimulation rate of 39.1 Hz, using 10, 20 and 100 second electroencephalography (EEG) recordings. Deconvolved responses confirm previous observations on the reduction and disappearance of the P1 MLR component during stage III and IV, obtained with standard averaging and stimulation methods. Results indicate that auditory stimulation at high rates during sleep, using short time sweeps, may help correlating the sleep EEG indicative of different arousal levels, with corresponding AEPs
Keywords :
auditory evoked potentials; deconvolution; electroencephalography; frequency-domain analysis; medical signal detection; medical signal processing; neurophysiology; sleep; transient analysis; 10 s; 100 s; 20 s; 39.1 Hz; EEG; auditory brainstem response; auditory evoked potential acquisition; continuous loop averaging deconvolution sequences; electroencephalography; frequency domain deconvolution; high-stimulus rates; long latency response; middle latency response; short time sweep; sleep; transient signals; Deconvolution; Delay; Electroencephalography; Equations; Frequency domain analysis; Intersymbol interference; Multilevel systems; Sleep; Testing; Transient response;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.260399
Filename :
4462922
Link To Document :
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