DocumentCode
472075
Title
Acquisition and Analysis of High Rate Deconvolved Auditory Evoked Potentials during Sleep
Author
Millan, Jorge ; Ozdamar, Ozcan ; Bohorquez, Jorge
Author_Institution
Dept. of Biomed. Eng., Miami Univ., Coral Gables, FL
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
4987
Lastpage
4990
Abstract
Auditory evoked potentials (AEPs) have been recorded at high stimulus rates during sleep using continuous loop averaging deconvolution (CLAD) sequences. AEP transient signals are obtained via frequency domain deconvolution of overlapped responses. Simultaneous acquisition of auditory brainstem response (ABR), middle latency response (MLR), and long latency response (LLR) is obtained at an average stimulation rate of 39.1 Hz, using 10, 20 and 100 second electroencephalography (EEG) recordings. Deconvolved responses confirm previous observations on the reduction and disappearance of the P1 MLR component during stage III and IV, obtained with standard averaging and stimulation methods. Results indicate that auditory stimulation at high rates during sleep, using short time sweeps, may help correlating the sleep EEG indicative of different arousal levels, with corresponding AEPs
Keywords
auditory evoked potentials; deconvolution; electroencephalography; frequency-domain analysis; medical signal detection; medical signal processing; neurophysiology; sleep; transient analysis; 10 s; 100 s; 20 s; 39.1 Hz; EEG; auditory brainstem response; auditory evoked potential acquisition; continuous loop averaging deconvolution sequences; electroencephalography; frequency domain deconvolution; high-stimulus rates; long latency response; middle latency response; short time sweep; sleep; transient signals; Deconvolution; Delay; Electroencephalography; Equations; Frequency domain analysis; Intersymbol interference; Multilevel systems; Sleep; Testing; Transient response;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.260399
Filename
4462922
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