• DocumentCode
    472089
  • Title

    Fully-Integrated Heart Rate Variability Monitoring System with an Efficient Memory

  • Author

    Wang, Xiaoyue ; Chen, Mingqi ; Macchiarulo, Luca ; Boric-Lubecke, Olga

  • Author_Institution
    Dept. of Electr. Eng., Hawaii Univ., Honolulu, HI
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    5064
  • Lastpage
    5067
  • Abstract
    Heart rate variability is a strong indicator of a number of medical conditions. Current HRV systems typically determine R-R intervals from pre-recorded ECG signals, which include a large amount of redundant data. In this paper we describe a more efficient HRV monitoring and assessment system on chip. By applying digital techniques to store the difference between every two adjacent R-R intervals in a single-port synchronous, high-performance SRAM, up to 24 hours of continuous ECG data can be stored on chip with a fixed resolution of 1 ms. The system has been tested for functionality, synthesized and laid out in a commercial 0.18mum CMOS process in a 2.5times2.5 mm2 hardware core with less than 155muW power consumption. Such a system can enable HRV monitoring with home based health care and implantable devices
  • Keywords
    SRAM chips; data compression; electrocardiography; medical signal processing; patient monitoring; CMOS process; ECG data compression; HRV system; R-R interval; digital signal processing; digital technique; heart rate variability monitoring system; home based health care; implantable device; single-port synchronous SRAM; system on chip; Biomedical monitoring; CMOS process; Electrocardiography; Hardware; Heart rate measurement; Heart rate variability; Medical conditions; Random access memory; System testing; System-on-a-chip; Digital signal processing; ECG data compression; Heart rate variability; SRAM; System on chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.259825
  • Filename
    4462942