DocumentCode
472126
Title
Rejection of artifact sources in magnetoencephalogram background activity using independent component analysis
Author
Escudero, Javier ; Hornero, Roberto ; Abasolo, Daniel ; Poza, Jesus ; Fernandez, Alberto ; Lopez, Miguel
Author_Institution
E.T.S. Ingenieros de Telecommun., Valladolid Univ.
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
5282
Lastpage
5285
Abstract
The aim of this pilot study was to assess the usefulness of independent component analysis (ICA) to detect cardiac artifacts and power line interferences in magnetoencephalogram (MEG) recordings. We recorded MEG signals from six subjects with a 148-channel whole-head magnetometer (MAGNES 2500 WH, 4D Neuroimaging). Epochs of 50 s with power line noise, cardiac, and ocular artifacts were selected for analysis. We applied a statistical criterion to determine the number of sources, and a robust ICA algorithm to decompose the MEG epochs. Skewness, kurtosis, and a spectral metric were used to mark the studied artifacts. We found that the power line interference could be easily detected by its frequency characteristics. Moreover, skewness outperformed kurtosis when identifying the cardiac artifact
Keywords
independent component analysis; interference (signal); magnetoencephalography; magnetometers; matrix decomposition; medical signal processing; neurophysiology; noise; source separation; 4D neuroimaging; MEG epochs; artifact source rejection; cardiac artifacts; independent component analysis; kurtosis; magnetoencephalogram background activity; matrix decomposition; ocular artifacts; power line interferences; power line noise; robust ICA algorithm; skewness; spectral metrics; whole-head magnetometer; Additive noise; Cities and towns; Electroencephalography; Frequency; Independent component analysis; Interference; Magnetic analysis; Magnetic field measurement; Magnetic shielding; Matrix decomposition;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.260215
Filename
4462996
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