DocumentCode
47232
Title
Noise Properties of Low-Temperature-Grown Co-Doped ZnO Nanorods as Ultraviolet Photodetectors
Author
Chung-Wei Liu ; Shoou-Jinn Chang ; Chih-Hung Hsiao ; Kuang-Yao Lo ; Tsung-Hsien Kao ; Bo-Chin Wang ; Sheng-Joue Young ; Kai-Shiang Tsai ; San-Lein Wu
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume
20
Issue
6
fYear
2014
fDate
Nov.-Dec. 2014
Firstpage
89
Lastpage
95
Abstract
The growth of vertically aligned cobalt-doped ZnO (Co-ZnO) nanorods on a glass substrate using a low-temperature hydrothermal method is reported. A Co-ZnO nanorod metal-semiconductor-metal ultraviolet photodetector (PD) was also fabricated. The ratio of UV-to-visible rejection of the fabricated PD was approximately 11700 when biased at 1 V with a sharp cutoff at 380 nm. With an incident light wavelength of 380 nm and an applied bias of 1 V, the measured responsivity of the PD was found to be 19.8 A/W. Furthermore, the dark noise equivalent power (NEP) and photo NEP of the fabricated Co-ZnO nanorod MSM PD were 1.3 × 10-13 and 1.8 × 10-11 W at the corresponding dark detectivities (D*) and photo D* of 1.1 × 1014 and 7.3 × 1011 cm · Hz 0.5 · W -1, respectively.
Keywords
II-VI semiconductors; cobalt; metal-semiconductor-metal structures; nanofabrication; nanorods; nanosensors; optical fabrication; optical noise; photodetectors; semiconductor growth; ultraviolet detectors; wide band gap semiconductors; zinc compounds; SiO2; UV-to-visible rejection; ZnO:Co; dark detectivity; dark noise equivalent power; glass substrate; incident light wavelength; low-temperature hydrothermal method; low-temperature-grown cobalt-doped nanorods; nanorod MSM photodetectors; noise properties; ultraviolet photodetectors; vertically aligned cobalt-doped nanorods; voltage 1 V; wavelength 380 nm; Current measurement; Lighting; Noise; Photodetectors; Semiconductor device measurement; Substrates; Zinc oxide; Co–ZnO nanorod; hydrothermal; noise; photodetector;
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/JSTQE.2014.2312935
Filename
6777340
Link To Document