• DocumentCode
    472533
  • Title

    Integrated electronic nose system for detection of Salmonella contamination in meat

  • Author

    Panigrahi, Suranjan ; Chang, Young ; Khot, Lav R. ; Glower, Jacob ; Logue, Catherine M.

  • Author_Institution
    North Dakota State Univ., Fargo
  • fYear
    2008
  • fDate
    12-14 Feb. 2008
  • Firstpage
    85
  • Lastpage
    88
  • Abstract
    A novel metal oxide based electronic nose system was designed and developed to detect Salmonella contamination in packaged meat (beef). This system contained an array of metal oxide detectors and custom made electronics for acquiring olfactory signature of the volatile organic compounds in the headspace of the meat packages produced by detector arrays. The acquired signals were processed using three wavelet packet transforms (WPT) for simultaneous noise reduction and compression. The coefficients of wavelet packets were used as features for developing statistical classification models using bootstrapped linear and quadratic discriminant analysis techniques. The average total classification accuracies for classifying Salmonella contaminated meat samples were higher than 82% with highest average accuracy of about 88%.
  • Keywords
    cellular biophysics; contamination; electronic noses; food products; microorganisms; organic compounds; wavelet transforms; Salmonella contamination detection; beef; bootstrapped linear analysis; integrated electronic nose; metal oxide detectors; noise compression; noise reduction; olfactory signature; packaged meat; quadratic discriminant analysis; volatile organic compounds; wavelet packet transforms; wavelet packets; Contamination; Electronic noses; Electronics packaging; Gas detectors; Olfactory; Sensor arrays; Signal processing; Volatile organic compounds; Wavelet packets; Wavelet transforms; Salmonella; electronic nose; food safety; metal oxide sensor; wavelet packet transform;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Sensors Applications Symposium, 2008. SAS 2008. IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-1962-3
  • Electronic_ISBN
    978-1-4244-1963-0
  • Type

    conf

  • Filename
    4472949