Title :
An Effect of Filler-Induced-Stress to DRAM Sense Amplifier
Author :
Arimoto, K. ; Yamagata, T. ; Miyamoto, H. ; Mashiko, K. ; Yamada, M. ; Sato, S. ; Shibata, H.
Author_Institution :
LSI R & D Laboratory, Mitsubishi Electric Corporation 4-1 Mizuhara, Itami 664 Japan
Keywords :
Circuits; Coatings; Grain size; Internal stresses; Plastic packaging; Random access memory; Residual stresses; Scanning electron microscopy; Testing; Voltage;
Conference_Titel :
VLSI Technology, 1985. Digest of Technical Papers. Symposium on
Conference_Location :
Kobe, Japan
Print_ISBN :
4-930813-09-3
