DocumentCode :
472668
Title :
Some Methods to Reduce Hot Carrier Effects
Author :
Chen, Kueing-long ; Saller, Steve ; Shah, Rajiv
Author_Institution :
Texas Instruments Incorporated MS 3669, P.O. Box 225012, Dallas, Texas 75265
fYear :
1985
fDate :
14-16 May 1985
Firstpage :
102
Lastpage :
103
Keywords :
Character generation; Circuit synthesis; Degradation; Hot carrier effects; Hot carriers; Implants; Instruments; Performance evaluation; Stress measurement; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1985. Digest of Technical Papers. Symposium on
Conference_Location :
Kobe, Japan
Print_ISBN :
4-930813-09-3
Type :
conf
Filename :
4480324
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=472668
بازگشت