DocumentCode
472668
Title
Some Methods to Reduce Hot Carrier Effects
Author
Chen, Kueing-long ; Saller, Steve ; Shah, Rajiv
Author_Institution
Texas Instruments Incorporated MS 3669, P.O. Box 225012, Dallas, Texas 75265
fYear
1985
fDate
14-16 May 1985
Firstpage
102
Lastpage
103
Keywords
Character generation; Circuit synthesis; Degradation; Hot carrier effects; Hot carriers; Implants; Instruments; Performance evaluation; Stress measurement; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 1985. Digest of Technical Papers. Symposium on
Conference_Location
Kobe, Japan
Print_ISBN
4-930813-09-3
Type
conf
Filename
4480324
Link To Document