DocumentCode :
472678
Title :
High Rate Reactive Ion Etching Using Collimated Beam Produced by 10-3 Torr Magnetron Discharge
Author :
Sekine, Masakazu ; Arikado, T. ; Okano, H. ; Horiike, Y.
Author_Institution :
VLSI Research Center, Toshiba Corp. 1, Toshiba-cho, Saiwai-ku, Kawasaki, 210, Japan
fYear :
1986
fDate :
28-30 May 1986
Firstpage :
5
Lastpage :
6
Abstract :
A new high rate RIE technology using a magnetron discharge in the low pressure of 10-3 Torr has been developed. A racetrack type permanent magnet, which is set at an anode, allows an intense plasma generation near a wafer surface on a cathode. The magnetic field divergence to the cathode provides uniform plasma intensity, leading to the uniform etching. The lower pressure discharge, at which ion collisions are reduced within the sheath, generates normally collimated ions. Thus, the directional etching, which does not depend so much on the aspect ratio variations, has been established.
Keywords :
Cathodes; Collimators; Electrons; Etching; Magnetic fields; Magnetic flux; Plasma accelerators; Plasma applications; Plasma density; Surface discharges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1986. Digest of Technical Papers. Symposium on
Conference_Location :
San Diego, CA, USA
Type :
conf
Filename :
4480342
Link To Document :
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