• DocumentCode
    472678
  • Title

    High Rate Reactive Ion Etching Using Collimated Beam Produced by 10-3 Torr Magnetron Discharge

  • Author

    Sekine, Masakazu ; Arikado, T. ; Okano, H. ; Horiike, Y.

  • Author_Institution
    VLSI Research Center, Toshiba Corp. 1, Toshiba-cho, Saiwai-ku, Kawasaki, 210, Japan
  • fYear
    1986
  • fDate
    28-30 May 1986
  • Firstpage
    5
  • Lastpage
    6
  • Abstract
    A new high rate RIE technology using a magnetron discharge in the low pressure of 10-3 Torr has been developed. A racetrack type permanent magnet, which is set at an anode, allows an intense plasma generation near a wafer surface on a cathode. The magnetic field divergence to the cathode provides uniform plasma intensity, leading to the uniform etching. The lower pressure discharge, at which ion collisions are reduced within the sheath, generates normally collimated ions. Thus, the directional etching, which does not depend so much on the aspect ratio variations, has been established.
  • Keywords
    Cathodes; Collimators; Electrons; Etching; Magnetic fields; Magnetic flux; Plasma accelerators; Plasma applications; Plasma density; Surface discharges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1986. Digest of Technical Papers. Symposium on
  • Conference_Location
    San Diego, CA, USA
  • Type

    conf

  • Filename
    4480342