DocumentCode
472678
Title
High Rate Reactive Ion Etching Using Collimated Beam Produced by 10-3 Torr Magnetron Discharge
Author
Sekine, Masakazu ; Arikado, T. ; Okano, H. ; Horiike, Y.
Author_Institution
VLSI Research Center, Toshiba Corp. 1, Toshiba-cho, Saiwai-ku, Kawasaki, 210, Japan
fYear
1986
fDate
28-30 May 1986
Firstpage
5
Lastpage
6
Abstract
A new high rate RIE technology using a magnetron discharge in the low pressure of 10-3 Torr has been developed. A racetrack type permanent magnet, which is set at an anode, allows an intense plasma generation near a wafer surface on a cathode. The magnetic field divergence to the cathode provides uniform plasma intensity, leading to the uniform etching. The lower pressure discharge, at which ion collisions are reduced within the sheath, generates normally collimated ions. Thus, the directional etching, which does not depend so much on the aspect ratio variations, has been established.
Keywords
Cathodes; Collimators; Electrons; Etching; Magnetic fields; Magnetic flux; Plasma accelerators; Plasma applications; Plasma density; Surface discharges;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 1986. Digest of Technical Papers. Symposium on
Conference_Location
San Diego, CA, USA
Type
conf
Filename
4480342
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