Title :
Self-Aligned Refresh Scheme for VLSI Intelligent Dynamic RAMs
Author :
Sawada, Kazuhiro ; Sakurai, Takayasu ; Nogami, Kazutaka ; Wada, Tetsunori ; Isobe, Mitsuo ; Iizuka, Tetsuya
Author_Institution :
Semiconductor Device Engineering Laboratory Toshiba Corporation 1-Komukai Toshiba. Saiwai-ku Kawasaki 210 Japan
Keywords :
Capacitors; Circuits; DRAM chips; Frequency; Intelligent sensors; Random access memory; Read-write memory; Sensor phenomena and characterization; Very large scale integration; Voltage;
Conference_Titel :
VLSI Technology, 1986. Digest of Technical Papers. Symposium on
Conference_Location :
San Diego, CA, USA
