Title :
Discontinuities in Very High-Speed Lossy Transmission Lines for Chip-to-Chip Interconnections
Author :
Kwon, Oh-Kyong ; Pease, R.F.W.
Author_Institution :
Stanford Electronics Labs. Stanford University, Stanford, CA 94305
Keywords :
Capacitance; Distributed parameter circuits; Equivalent circuits; Frequency; Impedance; Microstrip; Propagation losses; Reflection; Transmission line discontinuities; Transmission lines;
Conference_Titel :
VLSI Technology, 1987. Digest of Technical Papers. Symposium on
Conference_Location :
Karuizawa, Japan
