• DocumentCode
    472757
  • Title

    Low-Resistive and Selective Silicon Growth as a Self-Aligned Contact Hole Filler and Its Application to 1m Bit Static RAM

  • Author

    Shibata, H. ; Saitoh, M. ; Matsuno, T. ; Sasaki, H. ; Hashimoto, K. ; Matsunaga, Jun-Ichi ; Samata, S. ; Matsushita, Y.

  • Author_Institution
    Semiconductor Device Engineering Laboratory Toshiba Corporation 1, Komukai Toshiba-cho, Saiwai-ku, Kawasaki 210, Japan
  • fYear
    1987
  • fDate
    22-23 May 1987
  • Firstpage
    75
  • Lastpage
    76
  • Keywords
    Aluminum; Doping; Filling; Impurities; Isolation technology; Leakage current; Random access memory; Read-write memory; Silicon; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1987. Digest of Technical Papers. Symposium on
  • Conference_Location
    Karuizawa, Japan
  • Type

    conf

  • Filename
    4480429