472762

Fllcker Noise in CMOS: A Unified Model for VLSI Processes

Abidi, A.A. ; Viswanathan, C.R. ; Wu, J.J.-M. ; Wikstrom, J.A.

Integrated Circuits & Systems Laboratory Electrical Engineering Department University of California Los Angeles, CA 90024

1987

22-23 May 1987

85

86

1f noise; CMOS process; Fabrication; Fluctuations; Integrated circuit noise; MOS devices; MOSFETs; Semiconductor device modeling; Very large scale integration; Voltage;

English

ieee

VLSI Technology, 1987. Digest of Technical Papers. Symposium on

Karuizawa, Japan

conf

4480434