DocumentCode
472762
Title
Fllcker Noise in CMOS: A Unified Model for VLSI Processes
Author
Abidi, A.A. ; Viswanathan, C.R. ; Wu, J.J.-M. ; Wikstrom, J.A.
Author_Institution
Integrated Circuits & Systems Laboratory Electrical Engineering Department University of California Los Angeles, CA 90024
fYear
1987
fDate
22-23 May 1987
Firstpage
85
Lastpage
86
Keywords
1f noise; CMOS process; Fabrication; Fluctuations; Integrated circuit noise; MOS devices; MOSFETs; Semiconductor device modeling; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 1987. Digest of Technical Papers. Symposium on
Conference_Location
Karuizawa, Japan
Type
conf
Filename
4480434
Link To Document