Title :
High Speed Performance of a Basic ECL Gate with 1.25 Micron Design Rule
Author :
Yamamoto, H. ; Mizuno, O. ; Kubota, T. ; Nakamae, M. ; Shiraki, H. ; Ikushima, Y.
Author_Institution :
Nippon Electric Co., Ltd. 1120, Shimokuzawa, Sagamihara, Kanagawa 229, Japan
Keywords :
Circuits; Current measurement; Epitaxial layers; Fabrication; Frequency; Large scale integration; Lithography; Production; Propagation delay; Transistors;
Conference_Titel :
VLSI Technology, 1981. Digest of Technical Papers. Symposium on
Conference_Location :
Maui, HI, USA
