472792

Process Sensitivity of Depleted Base Bipolar Transistors (BSIT)

Stork, J.M.C. ; Plummer, J.D.

Integrated Circuits Lab, Stanford University Stanford, CA 94305

1981

9-11 Sept. 1981

40

41

Bipolar transistors; Circuit testing; Current control; Electric variables; Electrodes; Geometry; Integrated circuit testing; MOS devices; MOSFETs; Very large scale integration;

English

ieee

VLSI Technology, 1981. Digest of Technical Papers. Symposium on

Maui, HI, USA

conf

4480515