• DocumentCode
    472792
  • Title

    Process Sensitivity of Depleted Base Bipolar Transistors (BSIT)

  • Author

    Stork, J.M.C. ; Plummer, J.D.

  • Author_Institution
    Integrated Circuits Lab, Stanford University Stanford, CA 94305
  • fYear
    1981
  • fDate
    9-11 Sept. 1981
  • Firstpage
    40
  • Lastpage
    41
  • Keywords
    Bipolar transistors; Circuit testing; Current control; Electric variables; Electrodes; Geometry; Integrated circuit testing; MOS devices; MOSFETs; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1981. Digest of Technical Papers. Symposium on
  • Conference_Location
    Maui, HI, USA
  • Type

    conf

  • Filename
    4480515
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=472792