472794

Modeling and Control of Alpha-Particle Effects in Scaled-Down VLSI Circuits

Dennard, R.H. ; Sai-Halasz, G.A. ; Wordeman, M.R.

IBM, T.J. Watson Research Center P. O. Box 218, Yorktown Hts., N. Y. 10598

1981

9-11 Sept. 1981

44

45

Circuit simulation; Circuit testing; DRAM chips; Integrated circuit modeling; Ionizing radiation; Predictive models; Protection; Read-write memory; Solid modeling; Very large scale integration;

English

ieee

VLSI Technology, 1981. Digest of Technical Papers. Symposium on

Maui, HI, USA

conf

4480517