Title :
A Sub-Hundred NSEC DRAM Using the Taper Isolated Dynamic RAM Cell
Author :
Chatterjee, P.K. ; Leiss, J.E. ; Holloway, T.C.
Author_Institution :
VLSI Laboratory Texas Instruments Incorporated Dallas, Texas
Keywords :
Circuits; Clocks; DRAM chips; Decoding; Laboratories; Random access memory; Signal design; Transconductance; Very large scale integration; Voltage;
Conference_Titel :
VLSI Technology, 1981. Digest of Technical Papers. Symposium on
Conference_Location :
Maui, HI, USA
