• DocumentCode
    472825
  • Title

    "A 2μm Silicide Gate CMOS Processing for High Performance RAM Circuitries"

  • Author

    Yasuda, H. ; Hashimoto, K. ; Nozawa, H. ; Ochii, K. ; Kohyama, S.

  • Author_Institution
    Semiconductor Division, Toshiba Corp Saiwaiku, Kawasaki, 210, Japan
  • fYear
    1982
  • fDate
    1-3 Sept. 1982
  • Firstpage
    14
  • Lastpage
    15
  • Abstract
    With the increase of capacity in semiconductor memories, demands for higher speed and higher density CMOS RAMs have also been growing rapidly, still requiring to maintain their inherent low power advantages. In order to meet the demands I it is necessary to achieve an ingenious combination of advanced process and circuit technologies. In this paper, a hiah speed and low power circuit based on an internally synchronous system, a 2μm silicide gate CMOS process, and their optimized combination as a 16K bit RAM is described.
  • Keywords
    CMOS memory circuits; CMOS process; CMOS technology; Conductivity; Geometry; MOS devices; Pulse amplifiers; Semiconductor memory; Silicides; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1982. Digest of Technical Papers. Symposium on
  • Conference_Location
    Oiso, Japan
  • Type

    conf

  • Filename
    4480556