Title :
Self-Aligned Graded-Drain Structure for Short Channel MOS Transisitor
Author :
Satoh, S. ; Ohbayashi, Y. ; Mizuguchi, K. ; Yoneda, M. ; Abe, H.
Author_Institution :
LSI R&D Laboratory, Mitsubishi Electric Corp., Itami, Hyogo 664 Japan
Keywords :
Anisotropic magnetoresistance; Breakdown voltage; Electrons; Etching; Laboratories; Large scale integration; MOSFETs; Research and development; Very large scale integration; Voltage control;
Conference_Titel :
VLSI Technology, 1982. Digest of Technical Papers. Symposium on
Conference_Location :
Oiso, Japan