DocumentCode :
47284
Title :
Thermal Stability Characterization of the Au–Sn Bonding for High-Temperature Applications
Author :
Rodriguez, R.I. ; Ibitayo, Dimeji ; Quintero, P.O.
Author_Institution :
Dept. of Mech. Eng., Univ. of Puerto Rico, Mayagüez, Puerto Rico
Volume :
3
Issue :
4
fYear :
2013
fDate :
Apr-13
Firstpage :
549
Lastpage :
557
Abstract :
There is a need for electromechanical devices capable of operating in high-temperature environments (>200°C) for a wide variety of applications. Today´s wide-bandgap semiconductor-based power electronics have demonstrated a potential of operating above 400°C, however, they are still limited by packaging. Among the most promising alternatives is the Au-Sn eutectic solder, which has been widely used due to its excellent mechanical and thermal properties. However, the operating temperature of this metallurgical system is still limited to ~250°C owing to its melting temperature of 280°C. Therefore, a high-temperature-resistant system is much needed, but without affecting the current processing temperature of ~325°C, typically exhibited in most high-temperature Pb-free solders. In this paper, we present the development and characterization of a fluxless die-attach soldering process based on gold-enriched solid-liquid interdiffusion (SLID). A low-melting-point material (eutectic Au-Sn) is deposited in the face of a substrate, whereas a high-melting-point material, gold in this instance, is deposited in its mating substrate. Deposition of all materials was performed using a jet vapor deposition (JVD) equipment where thicknesses are controlled to achieve specific compositions in the mixture. Sandwiched coupons are isothermally processed in a vacuum reflow furnace for different reflow times. Post-processed samples confirm the interdiffusion mechanism as evidenced by the formation of sound joints that prove to be thermally stable up to ~490°C after the completion of the SLID process. Differential scanning calorimetry demonstrate the progression of the SLID process by quantifying the remaining low-melting-point constituent as a function of time and temperature, this serving as an indicator of the completion of the soldering process. Mechanical testing reveals a joint with shear strength varying from 39 to 45.5 MPa, demonstr- ting to be stable even after 500 h of isothermal aging. Moreover, these investigations successfully demonstrate the use of the Au-Sn SLID system and the JVD technology as potential manufacturing processes and as a lead-free die-attach technology.
Keywords :
ageing; chemical interdiffusion; differential scanning calorimetry; electronics packaging; eutectic alloys; furnaces; gold alloys; high-temperature effects; lead; melting; microassembling; power electronics; reflow soldering; shear strength; solders; thermal stability; vapour deposition; wide band gap semiconductors; Au-Sn; JVD equipment; JVD technology; SLID process; bonding; differential scanning calorimetry; electromechanical devices; eutectic solder; fluxless die-attach soldering process; gold-enriched solid-liquid interdiffusion; high-melting-point material; high-temperature applications; high-temperature environments; high-temperature-resistant system; interdiffusion mechanism; isothermal aging; jet vapor deposition equipment; lead-free die-attach technology; lead-free solders; low-melting-point material; manufacturing processes; mating substrate; mechanical property; mechanical testing; melting temperature; metallurgical system; operating temperature; packaging; pressure 39 MPa to 45.5 MPa; processing temperature; reflow times; sandwiched coupons; shear strength; temperature 280 C; thermal property; thermal stability characterization; time 500 h; vacuum reflow furnace; wide-bandgap semiconductor-based power electronics; Bonding; Gold; Heating; Isothermal processes; Substrates; Thermal stability; Fluxless; SLID; hermetic packages; isothermal solidification; jet vapor deposition (JVD); lead-free; shear strength; solder; transient liquid phase (TLP) bonding;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2013.2243205
Filename :
6451319
Link To Document :
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