Title :
Statistical Approach to VLSI Design
Author :
Hamel, J.D. ; Kemerer, D.W.
Author_Institution :
IBM General Technology Division Essex Junction, Vermont 05452
Keywords :
Circuits; Computer languages; Equations; Performance analysis; Performance evaluation; Response surface methodology; Semiconductor device measurement; Signal processing; Statistical analysis; Very large scale integration;
Conference_Titel :
VLSI Technology, 1982. Digest of Technical Papers. Symposium on
Conference_Location :
Oiso, Japan
