DocumentCode
472868
Title
Parasitic Resistance Effects on Static MOS RAM
Author
Shinohara, H. ; Anami, K. ; Yoshimoto, M. ; Hirata, Y. ; Nakano, T.
Author_Institution
LSI R&D Laboratory, Mitsubishi Electric Corp. Itami, Japan
fYear
1982
fDate
1-3 Sept. 1982
Firstpage
106
Lastpage
107
Keywords
Circuits; Electric resistance; Inverters; Laboratories; Large scale integration; Random access memory; Read-write memory; Research and development; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 1982. Digest of Technical Papers. Symposium on
Conference_Location
Oiso, Japan
Type
conf
Filename
4480599
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