Title :
Hit - An Analog/Digital Bipolar VLSI Technology
Author :
Watanabe, Tomoyuki ; Okabe, Takahiro ; Sakamoto, Kouzou ; Nagata, Minoru ; Muramatsu, Akira ; Ogura, Setsuo ; Hayashi, Makoto
Author_Institution :
Central Research Lab. Kokubunji, Tokyo
Keywords :
Delay effects; Delay estimation; Digital circuits; Isolation technology; Large scale integration; Lithography; Microcomputers; Semiconductor device measurement; Solid state circuits; Very large scale integration;
Conference_Titel :
VLSI Technology, 1982. Digest of Technical Papers. Symposium on
Conference_Location :
Oiso, Japan