Title : 
Submicron Optical Lithography Using a Double Layer Resist by a Single Development Technology
         
        
            Author : 
Tsuji, K. ; Sasago, M. ; Kugimiya, K.
         
        
            Author_Institution : 
Central Research Laboratory Matsushita Electric Industrial Company, Ltd. Moriguchi, Osaka 570, Japan
         
        
        
        
        
        
            Keywords : 
Coatings; Focusing; Image resolution; Laboratories; Lithography; Optical imaging; Planarization; Resists; Skin; Surface treatment;
         
        
        
        
            Conference_Titel : 
VLSI Technology, 1983. Digest of Technical Papers. Symposium on
         
        
            Conference_Location : 
Maui, HI, USA
         
        
            Print_ISBN : 
4-930813-05-0