472923

VLSI Design for Testability

McCluskey, E.J.

Center for Reliable Computing Computer Systems Laboratory Depts. of Comp. Sci. and Elec. Eng. Stanford University

1984

10-12 Sept. 1984

2

5

Circuit testing; Controllability; Design for testability; Integrated circuit testing; Observability; Pins; Semiconductor device measurement; Signal design; Test pattern generators; Very large scale integration;

English

ieee

VLSI Technology, 1984. Digest of Technical Papers. Symposium on

San Diego, CA, USA

4-930813-08-5

conf

4480672