Title :
Impact of IEC 61850 on the Protection Grading and Testing Process
Author_Institution :
OMICRON Electron., Houston, TX
Abstract :
The paper discusses the requirements of the protection grading and testing process from the point of view of exchange of data between different tools used to achieve these tasks. The IEC 61850 substation configuration language and the different types of files are analysed. The CIM and IEC 61850 models are described and requirements for harmonization are presented.
Keywords :
IEC standards; power system protection; substation protection; CIM models; IEC 61850 models; Substation Configuration Language; protection grading; protection testing; testing process; Computer integrated manufacturing; IEC; Object oriented modeling; Substations; Testing; Unified modeling language; XML;
Conference_Titel :
Developments in Power System Protection, 2008. DPSP 2008. IET 9th International Conference on
Conference_Location :
Glasgow
Print_ISBN :
978-0-86341-902-7
