DocumentCode
473177
Title
Impact of IEC 61850 on the Protection Grading and Testing Process
Author
Apostolov, Alex
Author_Institution
OMICRON Electron., Houston, TX
fYear
2008
fDate
17-20 March 2008
Firstpage
20
Lastpage
25
Abstract
The paper discusses the requirements of the protection grading and testing process from the point of view of exchange of data between different tools used to achieve these tasks. The IEC 61850 substation configuration language and the different types of files are analysed. The CIM and IEC 61850 models are described and requirements for harmonization are presented.
Keywords
IEC standards; power system protection; substation protection; CIM models; IEC 61850 models; Substation Configuration Language; protection grading; protection testing; testing process; Computer integrated manufacturing; IEC; Object oriented modeling; Substations; Testing; Unified modeling language; XML;
fLanguage
English
Publisher
iet
Conference_Titel
Developments in Power System Protection, 2008. DPSP 2008. IET 9th International Conference on
Conference_Location
Glasgow
ISSN
0537-9989
Print_ISBN
978-0-86341-902-7
Type
conf
Filename
4496953
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