Title :
Sample-induced beam distortions in terahertz time domain spectroscopy and imaging systems
Author :
Bowen, John W. ; Walker, Gillian C. ; Hadjiloucas, Sillas
Author_Institution :
Sch. of Syst. Eng., Univ. of Reading, Reading
Abstract :
It is demonstrated that distortion of the terahertz beam profile and generation of a cross-polarised component occur when the beam in terahertz time domain spectroscopy and imaging systems interacts with the sample under test. These distortions modify the detected signal, leading to spectral and image artefacts. The degree of distortion depends on the optical design of the system as well as the properties of the sample.
Keywords :
submillimetre wave imaging; submillimetre wave spectroscopy; cross-polarised components; sample-induced beam distortions; signal detection; terahertz imaging systems; terahertz time domain spectroscopy; Biomedical optical imaging; Focusing; Optical distortion; Optical imaging; Optical polarization; Optical propagation; Optical scattering; Signal detection; Spectroscopy; System testing; angular spectrum; long wave optics; modelling; pulsed terahertz radiation;
Conference_Titel :
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1438-3
DOI :
10.1109/ICIMW.2007.4516463
