DocumentCode :
473968
Title :
THz time-domain spectroscopy uncertainties
Author :
Lin, Hungyen ; Withayachumnankul, W. ; Fischer, Bernd M. ; Mickan, Samuel P. ; Abbott, Derek
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Adelaide, Adelaide, SA
fYear :
2007
fDate :
2-9 Sept. 2007
Firstpage :
222
Lastpage :
223
Abstract :
THz time-domain spectroscopy (TDS) is a significant technique for material characterization as it seeks to determine the optical or dielectric constants in the T-ray regime. The precision of the constants is highly affected by the intricate THz-TDS process. Typically, a short-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision and therefore has an effect on the uncertainty of the achieved optical or dielectric constants. This paper analyses sources of uncertainty and models error propagation through the system.
Keywords :
optical constants; permittivity; submillimetre wave spectroscopy; time-domain analysis; THz time-domain spectroscopy; THz-TDS process; dielectric constants; error propagation; material characterization; optical constants; Fluctuations; Optical noise; Optical propagation; Optical pumping; Optical refraction; Optical variables control; Spectroscopy; Time domain analysis; Ultrafast optics; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1438-3
Type :
conf
DOI :
10.1109/ICIMW.2007.4516470
Filename :
4516470
Link To Document :
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