Title :
Loss mechanisms for T-ray microwires
Author :
Atakaramians, Shaghik ; Vahid, Shahraam ; Fischer, Bernd M. ; Abbott, Derek ; Monro, Tanya M.
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Adelaide, Adelaide, SA
Abstract :
In this paper we will present predictions for loss mechanisms caused by material, waveguide, surface roughness and bends in microwires and estimate their affect on the total loss in the terahertz regime.
Keywords :
losses; submillimetre waves; surface roughness; waveguides; wires (electric); T-ray microwires; THz region; bend loss; loss mechanisms; material losses; surface roughness; terahertz region; waveguide losses; Dielectric loss measurement; Electromagnetic waveguides; Hollow waveguides; Optical fiber losses; Optical losses; Optical materials; Optical waveguides; Propagation losses; Rectangular waveguides; Waveguide discontinuities;
Conference_Titel :
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1438-3
DOI :
10.1109/ICIMW.2007.4516743
