Development status of a 420–1980 GHz vector network analyzer for time-domain reflectometry and imaging applications

Author

Jellema, Willem ; Baryshev, Andrey ; Paveliev, Dimitri ; Hesler, Jeffrey ; Wild, Wolfgang ; Withington, Stafford

Author_Institution

SRON Nat. Inst. for Space Res., Groningen

fYear

2007

fDate

2-9 Sept. 2007

Firstpage

968

Lastpage

969

Abstract

With recent progress in the area of electronically tunable solid-state sources it is possible to fully extend microwave measurement techniques into the THz frequency range. In this paper we present the development status of a 420-1980 GHz vector network analyzer and illustrate how phase-sensitive heterodyne techniques can be used in the area of THz reflectometry and imaging.

Keywords

network analysers; submillimetre wave imaging; time-domain reflectometry; electronically tunable solid-state sources; frequency 420 GHz to 1980 GHz; microwave measurement techniques; phase-sensitive heterodyne techniques; submillimeter wave imaging; time-domain reflectometry; vector network analyzer; Bandwidth; Extraterrestrial measurements; Frequency; Image analysis; Phase measurement; Power harmonic filters; Reflectometry; Spectroscopy; Superlattices; Time domain analysis; THz; heterodyne; imaging; phasesensitive; reflectometry; submillimeter-wave; vector network analyzer;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on

Conference_Location

Cardiff

Print_ISBN

978-1-4244-1438-3

Type

conf

DOI

10.1109/ICIMW.2007.4516813

Filename

4516813